SCI is a leading innovator and provider of advanced metrology systems and analysis software to major companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries.

Our mission is to solve our clients’ most critical metrology challenges by providing leading-edge solutions to precisely suit their requirements. We value close cooperation and long-term partnership to understand and anticipate your current and future needs.

To meet these demands, our expanding technology suite of multi-modal metrology systems includes multi-angle spectroscopic ellipsometry, polarized reflectometry, transmission, and scatterometry. Our complete product portfolio serves our clients throughout the entire product life cycle, from research and development to high-volume production. We are dedicated to building custom solutions, as needed, to solve your specific requirements.

We hold an extensive portfolio of key patents allowing for the highest index measurement accuracy in the industry, with a resolution 100 times better than existing tools. We continue to pioneer new technology in high-precision optical design and software modeling. Our technology is deployed in the world’s leading development and production facilities in a broad range of industries.

SCI was founded in 1993 as a privately held corporation headquartered in Carlsbad, California. Today, we comprise a global network of sales, service, and support offices strategically located in China, Europe, Japan, Korea, Singapore, Taiwan, and the United States.