FilmTek™ 3000 Advantages

  • Combination of reflection and transmission spectrophotometry allows for accurate characterization of OLED display materials.
  • Transmission spectrophotometry is an ideal method for measuring absorption and provides better resolution of the film’s extinction coefficient (k) compared with spectroscopic ellipsometry.
  • Combining reflection and transmission spectrophotometry provides two data sets with enough information content to uniquely determine the thickness and optical constants of thin absorbing films on transparent substrates.
  • Analysis of reflection and transmission data gives accurate thickness values as well as the refractive index and extinction coefficients as a function of wavelength.
  • Using a general dispersion model to model the optical response reduces the number of fitted parameters required, eliminating multiple solutions.
  • Simultaneous measurement of multiple OLED layer thicknesses.
  • Measurement and analysis time of 1-2 seconds per point.


Schematic of a Typical OLED Device


Modeled Reflection and Transmission Data of Single Layer OLED Films on Glass


Optical Constants Determined from Fitted Reflection and Transmission Spectra


Modeled Reflection and Transmission Spectra of a Multi-layer OLED Film Stack on Glass
Reflection, transmission spectrophotometry characterizes OLED material